Eddy current testing is a well-established method of nondestructive testing that is used to examine nonferrous/nonmagnetic materials such as condenser and heat exchanger tubes in power generation ...

Several companies are developing or shipping next-generation e-beam inspection systems in an effort to reduce defects in advanced logic and memory chips. Vendors are taking two approaches with these ...

A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car's steering to making your laptop more susceptible to ...

Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...

X-ray microscopes are essential for examining components and materials because they can be used to detect changes and details in the material. Until now, however, it has been difficult to detect small ...

Hidden semiconductor defects often pass inspection but fail later in operation. Learn how latent defects form, evade ...

To further shrink electronic devices and to lower energy consumption, the semiconductor industry is interested in using 2D materials, but manufacturers need a quick and accurate method for detecting ...

SPONSORED: Quality control and efficient O&M of rooftop commercial PV installations are economic and technical challenges, but essential nonetheless. The key objective in conducting O&M is to ensure ...