When a global provider of air traffic, navigation, and landing system solutions began implementing its next-generation system, limitations of an existing test and debug methodology directly impacted ...

With complexity of sub-90nm SOCs driving the need for test to be integrated throughout the design process, both of EDA’s largest vendors today introduced major upgrades to their respective offerings.

Because electronic systems for all applications in end-user markets must provide the highest possible reliability to match customers’ quality expectations, semiconductor components undergo multiple ...

Scientists have discovered a novel low-cost method of testing for cancers. Called the Heatrich-BS assay, this new test sequences clinical samples that have been heated in order to isolate ...