Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...
Since its ratification in the early 1990s, the IEEE 1149.1 Boundary Scan (JTAG) specification has shown that a well-thought-out standard can be resilient, adaptive, and quite useful in applications ...
Boundry-scan testing (IEEE1149.1/JTAG) is a novel procedure for some test engineers and technicians. But ScanWorks Interconnect Development Station version 3.4 from Asset Intertech should ease their ...
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