University of Illinois Physics Professor Paul Kwiat and members of his research group have developed a new tool for precision measurement at the nanometer scale in scenarios where background noise and ...
This image compares data from two Iceye Synthetic Aperture Radar images. Changes in the vertical height of the surface appear black. Areas without changes are depicted in white. Credit: Iceye SAN ...
Electronic and computer processors with a higher speed need smaller features for integrated circuits (IC), which also need smoother and smaller substrate surfaces. Chemical mechanical polishing (CMP) ...
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