Literally, IEEE Std. 1149.1 very well might have been your father’s JTAG, since it has been around since 1990. For over 20 years, this standard has been in use throughout the world (boundary-scan ...
MANHASSET, N.Y. — The Semiconductor Test Consortium has announced its support of the IEEE Standard Test Interface Language Committee, an industry consortium of integrated circuit producers and ...
The IEEE Communications Society has launched a web site to provide detailed information on its recently introduced certification program for wireless technologies. The Wireless Communications ...
A decade-old research paper seen as a “blueprint” for the first practical use of zero-knowledge proofs (ZK-proofs) has received an award from the Institute of Electrical and Electronics Engineers ...
September 11, 2013. Synopsys Inc. has announced the availability of its DesignWare STAR Hierarchical System, an automated hierarchical test solution for efficiently testing SoCs, including ...
In recent years there has been a sharp rise of multi-die system designs. Numerous publications targeting a large variety of applications exist in the public domain. One presentation [2] on the IEEE’s ...
Multi-die design using 2.5D and 3D technologies has emerged as a necessity to keep the pace of innovation. For all their ...
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