A next-generation board-test system combines structural, parametric, high-speed interconnect, and functional testing to address the growing complexity of AI and data-centre hardware manufacturing.

Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...

Check out our NI Connect 2022 coverage. For years, NI has focused on the ability of software to tie together its test equipment and evaluate vast quantities of data to help companies reduce their time ...

November 23, 2012. Aeroflex Ltd. announced that it now offers its 5800 Series multi-functional test system with a Virginia Panel interface, an industry-standard interface used by test fixture ...

Part I of this series introduced the lead/lag control strategy as it applies to parallel pump operation and discussed the need for identifying the designer’s intent for a particular system. Part II ...