The high sensitivity of the reflection electron microscopy (REM) technique to small changes in the crystal structure and composition of the top surface layers of various crystalline materials makes it ...

Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

(Nanowerk News) An international team of researchers, led by Professor Yu Zou (MSE), is using electric fields to control the motion of material defects. This work has important implications for ...

Electron microscopy is a powerful technique that provides high-resolution images by focusing a beam of electrons to reveal fine structural details in biological and material specimens. 2 Because ...

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...