This paper presents serial cardiac-catheterization data showing spontaneous functional closure of large symptomatic defects in 3 infants. One had an associated moderate-sized patent ductus arteriosus ...

Catching all defects in chip packaging is becoming more difficult, requiring a mix of electrical tests, metrology screening, and various types of inspection. And the more critical the application for ...

During 7nm gate poly removal process, polysilicon is removed exposing both NFET and PFET fins in preparation for high-k gate oxide. If the polysilicon etch is too aggressive or the source and drain ...