Recently, DFT elements have begun to show up in more and more large complex SoC devices. The concept of scan no longer raises the objections of overhead to the extent it used to. Yet, customers and ...

EDA start-up DeFacTo Technologies has the ambitious goal of making obsolete gate-level DFT (design for test) by moving DFT further up in the IC-design process to the RTL (register-transfer level) ...

With system-on-a-chip (SoC) complexity rising dramatically, so too has the total cost of testing these devices. A technology partnership between Cadence Design Systems of San Jose, Calif., and ...

The purpose of electronic design automation (EDA) software is to solve SoC design problems and simplify the entire process. For design for test (DFT), this means aiming to streamline the DFT ...

Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...

In recent years, boundary scan has transformed itself. JTAG started more than a decade ago as a simple structural interconnect test technology. It now is a foundational embedded infrastructure capable ...