You might talk about it often, but do you really know what compression is all about? Every engine has to make it and those that don't are hurtin' for sure. But, here's the confusing part, for this ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...

IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...