Once IC fabrication is complete, engineers use fault models to create test patterns that detect defects. These fault models are typically abstractions of defect behavior based on our experience and ...
Advanced ATPG products support simultaneous analysis of multiple fault models, leverage multi-threading and on-chip compression to improve quality and reduce turnaround time and costs of nanometer ICs ...
Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...
The IDDQ test relies on measuring the supply current (I DD) of an IC’s quiescent state, when the circuit isn’t switching and inputs are held at static values. Test patterns are used to place the ...
Growing pressure to improve IC reliability in safety- and mission-critical applications is fueling demand for custom automated test pattern generation (ATPG) to detect small timing delays, and for ...
Mountain View, CA. Synopsys Inc. at ITC announced a new, breakthrough ATPG and diagnostics technology that delivers 10X faster run time and 25% fewer test patterns to shorten schedules, accelerate ...
Bangalore, Oct. 22, 2007 – Magma Design Automation Inc. (Nasdaq: LAVA), a provider of chip design software, today unveiled Talus® ATPG and Talus ATPG-X with on-chip compression. These advanced ...
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